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Wafer Level Reliability of Advanced CMOS Devices & Processes
Edited by: Yi Zhao, Edited by: Terence B Hook, Edited by: Xinggong Wan
Published
by Nova Science Publishers, Inc (US)
Temporarily Out-of-Stock
Available to Pre-order
£97.99
Pages: 195
Illustrations: tables, charts & illus
ISBN: 9781604567137
Publication Date: 26-Nov-2008
Semi-conductors & super-conductors