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Radiation Defects in Ion Implanted &/or High-Energy Irradiated MOS Structures
By (author): S Kaschieva, By (author): S Ndmitriev
Published
by Nova Science Publishers, Inc (US)
In Stock
£143.99
Pages: 196
Illustrations: tables & charts
ISBN: 9781608761883
Publication Date: 18-May-2010
Electrical engineering